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Since its introduction, the atomic force microscope (AFM) has developed into a ubiquitous tool for 3D imaging and manipulating objects at a nanoscale level. However, the imaging performance of AFMs is limited because of the limitations of its scanning unit, i.e., piezoelectric tube scanner (PTS). This paper addresses the design and experimental implementation of a two-input two-output (TITO) model...
There is a need, in the wide ranging scientific community, to perform fast scans using atomic force microscope (AFM) with nanoscale accuracy. The performance of AFM at high scanning speeds is limited due to some serious limitations of its scanning unit; i.e., the piezoelectric tube scanner (PTS). In order to increase the imaging speed of an AFM, a multi-input multi-output (MIMO) model predictive control...
This article presents the design and experimental implementation of an observer-based model predictive control (OMPC) scheme with a notch filter which aims to compensate for the effects of creep, hysteresis, cross-coupling, and vibration in piezoactuators in order to improve the nanopositioning of an atomic force microscope (AFM). The controller design is based on an identified model of the piezoelectric...
Tracking a reference signal is one of the major problems of an atomic force microscope (AFM). This article presents the design and experimental implementation of a model predictive control (MPC) scheme, with a vibration compensator for achieving accurate tracking for an AFM at higher scanning rates. To evaluate the improvement in performance attained by this control scheme, an experimental comparison...
This paper demonstrates the design and experimental implementation of an observer based model predictive control (OMPC) with a notch filter for the positioning of the piezoelectric tube (PZT) scanner of an atomic force microscope (AFM). This control scheme achieves active damping of the resonant mode of the PZT scanner and accurate tracking of a reference triangular signal. Kalman filter is used to...
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