The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Residual strain around conical nanoindentations on silicon single crystals is mapped by electronic backscatter diffraction system and CrossCourt software. Both of the (001) and (111) planes display anisotropic strain features adjacent to nanoindentations in specific crystallographic orientations with strain resolutions of 3.5×10 −4 and 3.3×10 −4 for Si(001) and (111) surfaces, respectively...
Residual strain around pyramidal nanoindentations on single-crystal silicon is mapped by electronic backscatter diffraction system and CrossCourt software. Both of the (001) and (111) planes present anisotropic strain features adjacent to indentations in specific crystallographic orientations with strain resolutions of 2.2×10 −4 and 2.5×10 −4 for Si (001) and (111) surfaces, respectively...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.