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Scan shift power can be reduced by activating only a subset of scan cells in each shift cycle. In contrast to shift power reduction, the use of only a subset of scan cells to capture responses in a cycle may cause capture violations, thereby leading to fault coverage loss. In order to restore the original fault coverage, new test patterns must be generated, leading to higher test-data volume. In this...
Most previous DFT-based techniques for low-capture-power broadside testing can only reduce test power in one of the two capture cycles, launch cycle and capture cycle. Even if some methods can reduce both of them, they may make some testable faults in standard broadside testing untestable. In this paper, a new test application scheme called partial launch-on-capture (PLOC) is proposed to solve the...
Test power, volume, and time are the major test cost parameters that must be minimized while achieving the desired level of fault coverage. Unlike prior research in delay fault testing that has focused on at most two test cost parameters, the hybrid (LOS+LOC) scheme proposed here simultaneously considers all three cost parameters and achieves better fault coverage than prior schemes, as demonstrated...
This paper presents a new method for improving transition fault coverage in hybrid scan testing. It is based on a novel test application scheme, in order to break the functional dependence of broadside testing. The new technique analyzes the automatic test pattern generation conflicts in broadside test generation and skewed-load test generation, and tries to control the flip-flops with the most influence...
Testing for small-delay defects requires fault-effect propagation along the longest testable paths. However, the selection of the longest testable paths requires high CPU time and leads to large pattern counts. Dynamic test compaction for small-delay defects has remained largely unexplored thus far. We propose a path-selection scheme to accelerate ATPG based on stored testable critical-path information...
We propose a compact test generation method for transition faults, which is driven by a conflict-avoidance scheme employed during test generation. Based on an influence-cone function for transition faults in broadside scan testing, two dynamic test compaction schemes, named selfish test compaction and unselfish test compaction respectively, are proposed. The selfish test compaction tries to compact...
The small delay defects testing has two challenges. One is that the longest testable path selection for every target fault in ATPG consumes much CPU time. The other is the test data volume are very large. In this paper, we propose two strategies to resolve these two problems. A new path selection in advance scheme is proposed to accelerate ATPG. It aims to find fewer paths and cover more faults in...
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