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28-Nm planar, 20-nm planar, and 16-nm FinFET technology combinational and flip-flop circuits are investigated using different LET particles. An analytical model is developed to study the ratio of logic to flip-flop (FF) single-event (SE) cross-section as a function of LET particles. Results indicate that high-LET particles have a much stronger impact on the logic single-event (SE) cross-section as...
This paper presents a novel discriminative training algorithm for n-gram language models for use in large vocabulary continuous speech recognition. The algorithm uses Maximum Mutual Information Estimation (MMIE) to build an objective function that involves a metric computed between correct transcriptions and their competing hypotheses, which are encoded as word graphs generated from the Viterbi decoding...
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