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Warpage, high stress in dies and solder joints are introduced in assembly process of a package-on-package component. In this paper, a finite element approach is proposed to predict the warpages and stresses during the full assembly process. By the techniques of element die and birth as well as restart method, the approach is able to transfer the stress and warpage in one process to the next so that...
Intermetallic compounds (IMCs) that grow on the interface between the solder alloy and its bonding pads play a crucial role in the reliability of solder joints. It has been identified that the cracking around the IMC layer is the primary failure mode in lead-free solder joints. Therefore the mechanical behavior of the IMC has attracted great attentions. In this paper, mechanical properties of two...
The effects of the moment, axial force and shear force induced during drop impact on the peeling stress of the solder joints were investigated by a 2-D beam model and a 3-D solid model of board level electronic package. It shows that the peeling stress is dominated by the bending stress and the maximum occurs at the PCB end. Results of the two models indicated that in the solder joint array only a...
In this paper, the damage fracture of solder joints in board level electronic package subjected to drop impact loadings was numerically simulated by the finite element method and the cohesive zone model. The solder-Cu pad interface was modeled by cohesive zone elements. The results show that fracture initiates at the edge of the PCB side and the damage of solder joint is affected greatly by the used...
The strain rate dependent Johnson-Cook material model and the rate independent elastic-plastic model of lead-free solders were used to investigate influence of strain rate effect on the mechanical behavior of solder joints under drop impact loadings. Failure of the solder joints was predicted and the results were compared with the experimental observations. The strain rate effect of lead-free solders...
The reliability of board level electronic package subjected to drop impact loadings is one of the most concerned issues. In this paper, a standard board level drop impact test was modeled as double cantilever beam model. The deflection and curvature of the Printed Circuit Board (PCB) and the component were compared with that derived from static analysis in order to understand the influence of dynamic...
A 3-D finite element model of board level BGA package was built and the Input-G method was used to analyze dynamic solder joint stress in the package during drop/impact. Boundary condition, bolt effects of the test board and peeling stress mechanism were emphasized in current investigation. Dynamic responses of solder joint in frequency domain and time domain were analyzed to find main mechanism of...
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