Search results for: H. Lin
IEEE Electron Device Letters > 2017 > 38 > 9 > 1224 - 1227
Electronics Letters > 2017 > 53 > 15-Regular Papers > 1056 - 1058
IEEE Electron Device Letters > 2017 > 38 > 7 > 887 - 889
2017 IEEE International Reliability Physics Symposium (IRPS) > 3A-5.1 - 3A-5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 35.6.1 - 35.6.4
IEEE Transactions on Plasma Science > 2016 > 44 > 12-2 > 3140 - 3147