Search results for: Yanling Tian
Journal of Microscopy > 289 > 3 > 187 - 197
Surface and Interface Analysis > 54 > 10 > 1087 - 1097
Land Degradation & Development > 33 > 13 > 2246 - 2257
Journal of Microscopy > 287 > 1 > 3 - 18
IEEJ Transactions on Electrical and Electronic Engineering > 17 > 5 > 685 - 694
IEEJ Transactions on Electrical and Electronic Engineering > 17 > 3 > 445 - 453
IEEJ Transactions on Electrical and Electronic Engineering > 17 > 3 > 398 - 406
IEEJ Transactions on Electrical and Electronic Engineering > 16 > 12 > 1618 - 1627
IEEJ Transactions on Electrical and Electronic Engineering > 16 > 3 > 455 - 463
IEEJ Transactions on Electrical and Electronic Engineering > 15 > 12 > 1791 - 1800