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This paper describes a test response compaction method that preserves diagnostic information and enables performing a test-per-clock offline test. The test response compaction system is based on a chain of T flip-flops. The T flip-flop signature chain can preserve the information about the positions of the erroneous test response occurrence and the information about the clock cycle when the erroneous...
The paper presents a test-data volume-compression method which reduces test time and hardware overhead by test pattern broadcast into parallel scan chains. The proposed hardware enables efficient test pattern decompression and test response compaction. It uses a XOR-less structure instead of ring generators for test pattern decompression. Decompressed test vectors are obtained from the previously...
This paper describes a methodology of creating a built-in test system of a system on chip and experimental results of the system application on the AT94K FPSLIC with cores designed according to the IEEE 1500 standard. The system spares memory and keeps acceptable test access mechanism requirements. The system uses built-in processor for test control and the embedded RAM memory for storing both the...
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