Search results for: Michael Oehme
Journal of Raman Spectroscopy > 52 > 6 > 1167 - 1175
Thin Solid Films > 2014 > 557 > C > 169-172
physica status solidi (b) > 249 > 4 > 764 - 772
Materials Science in Semiconductor Processing > 2005 > 8 > 1-3 > 149-153