Search results for: P. Balasubramanian
Engineering Science and Technology, an International Journal > 2017 > 20 > 3 > 1066-1074
SpringerPlus > 2016 > 5 > 1 > 1-16
SpringerPlus > 2016 > 5 > 1 > 1-26
Microelectronics Reliability > 2015 > 55 > 9-10 > 1373-1378