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We report on the conductive-atomic force microscopy (C-AFM) study of metallic layers in order to find the most suitable configuration for electrical characterization of individual ZnO micro-pillars fabricated by focused ion beam (FIB). The electrical resistance between the probe tip and both as deposited and FIB processed metal layers (namely, Cr, Ti, Au and Al) has been investigated. Both chromium...
Zinc oxide structures with size in the micro and nano-scale range represent key candidates for developing novel, cheap and efficient electronic devices, power generators and sensors based on the cooperative response of a large number of synced structures. The accurate electrical characterization of single ZnO micro/nanostructures is thus critical for assessing and optimizing the device performance...
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