Search results for: Antonis Paschalis
Journal of Electronic Testing > 2003 > 19 > 3 > 285-298
Integration, the VLSI Journal > 1996 > 21 > 3 > 209-228
Journal of Electronic Testing > 2003 > 19 > 3 > 285-298
Integration, the VLSI Journal > 1996 > 21 > 3 > 209-228