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Steady-state current–voltage (I–V) and impedance–voltage (Z–V) measurements were performed on in situ (UHV) prepared metal (Ag, Al)/Alq 3 /indium-tin oxide (ITO) devices after exposure to air. When increasing the positive bias on the top metal electrode to a relatively well-defined critical value, a transition from semiconducting to semi- or even insulating behavior of the contacted Alq ...
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