Search results for: Y. H. Lee
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-3-1 - 4B-3-5
2012 International Electron Devices Meeting > 4.6.1 - 4.6.4
IEEE Translation Journal on Magnetics in Japan > 1992 > 7 > 7 > 573 - 579
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-3-1 - 4B-3-5
2012 International Electron Devices Meeting > 4.6.1 - 4.6.4
IEEE Translation Journal on Magnetics in Japan > 1992 > 7 > 7 > 573 - 579