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A primary-auxiliary temperature sensing scheme for system-on-a-chip application is proposed in this paper. Taking advantage of the high accuracy and linearity of the analog primary temperature sensors and low production cost of the digital auxiliary temperature sensors, this sensing scheme monitors multiple hotspots in a highly integrated system chip with small area and low power. A cost efficient...
In this paper, a bit weight extraction technique is proposed to test and calibrate the successive approximation register (SAR) analog-to-digital converter (ADC). The proposed technique is based on major carrier transition (MCT) testing, the MCTs are generated through simple capacitor switching and then measured by the embedded comparator and a coarse design-for-test (DfT) digital-to-analog converter...
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