Search results for: P. T. Lai
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 520 - 528
IEEE Transactions on Magnetics > 2011 > 47 > 3 > 714 - 717
IEEE Transactions on Magnetics > 2011 > 47 > 3 > 602 - 612
IEEE Electron Device Letters > 2011 > 32 > 1 > 93 - 95