Search results for: Santosh Biswas
Journal of Electronic Testing > 2019 > 35 > 4 > 441-457
Journal of Electronic Testing > 2019 > 35 > 2 > 215-243
International Journal of Wireless Information Networks > 2018 > 25 > 4 > 399-421
International Journal of Wireless Information Networks > 2018 > 25 > 2 > 130-145
Journal of Network and Computer Applications > 2018 > 104 > C > 1-20
Journal of Electronic Testing > 2018 > 34 > 1 > 83-103
International Journal of Circuit Theory and Applications > 45 > 11 > 1701 - 1741
TENCON 2017 - 2017 IEEE Region 10 Conference > 234 - 239
TENCON 2017 - 2017 IEEE Region 10 Conference > 2006 - 2011
Microelectronics Journal > 2017 > 67 > C > 88-100
Automatica > 2017 > 82 > C > 332-334
Journal of Electronic Testing > 2017 > 33 > 2 > 227-254
Journal of Applied Mathematics and Computing > 2018 > 57 > 1-2 > 161-197
Security and Communication Networks > 9 > 18 > 4863 - 4881
IEEE/CAA Journal of Automatica Sinica > 2017 > 4 > 4 > 792 - 808