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Under the global trend of energy and emission reduction, light emitting diode (LED) has attracted more and more people's attention due to its distinctive advantages of long lifetime, high reliability, low energy consumption, green environmental protection. However, in order to evaluate the reliability of LED luminaires, few or no failure time data could be obtained with the traditional accelerated...
In this paper, a multivariate system reliability estimation method based on step stress accelerated degradation testing is proposed. Firstly, the method of step stress accelerated degradation testing (SSADT) is utilized to evaluate the reliability of LED luminaries. In the test, temperature is determined as the sensitive stress. Secondly, we suppose that all the performance metrics follow normal distribution...
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