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Design-for-Test (DFT) techniques have been developed to improve testability of integrated circuits. Among the known DFT techniques, scan-based testing is considered an efficient solution for digital circuits. However, scan architecture can be exploited to wage a side channel attack. Scan chains can be used to access a cryptographic core to extract the private encryption key. There is an emerging demand...
Scan based Design for Test (DfT) schemes have been in wide use to increase the testability of digital circuits. The main objective is to ensure that nodes in the Circuit Under Test (CUT) are controllable and observable. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation. In this work, a new method is presented to...
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