The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Security is the main challenge in the design and implementation of today's ubiquitous interconnected objects on the Internet network infrastructure. Many security solutions have been already proposed to address security concerns for IoT enabled devices. In this paper, an integrated approach for authentication and access control is presented for communication with wireless sensor nodes in IoT networks...
Scan chains are exploited to develop attacks on cryptographic hardware to extract secret information. For a scan-enabled chip, the probability of success increases if a user has unlimited access to apply test patterns to the Circuit-Under-Test (CUT) and observe the responses. In this paper, two layers of security have been proposed to protect scan architecture against hackers. A tester authentication...
Device identification has been considered as a main trend to maintain security in wireless communications. Specific characteristics of different components of transmitters have been recently exploited as their RF fingerprints. In this paper, a new method is presented to uniquely identify a transmitter using a phase locking mechanism. In the proposed method, a Phase-Locked Loop is used to lock on the...
Design-for-Test (DFT) techniques have been developed to improve testability of integrated circuits. Among the known DFT techniques, scan-based testing is considered an efficient solution for digital circuits. However, scan architecture can be exploited to wage a side channel attack. Scan chains can be used to access a cryptographic core to extract the private encryption key. There is an emerging demand...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.