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Package warpage is often a problem in surface mount reflow process especially for thin package. Large warpage prevents package solder balls to be connected to PCB pads and results in low process yield. In order to effectively minimize warpage in reflow process, this paper proposed a new approach to reduce package warpage by temporally bonding the back of the packaged component to a rigid plate. In...
Electronics with higher Input/Output (I/O) density and smaller package size challenge the fine pitch flip chip technology. Thermal compression bonding combined with pre-applied non-conductive film (TC-NCF) has the advantages of simplifying the process steps, protecting interconnects in situ, avoiding the flux residue and having no concerns of adhesive overflow issue. It is a promising process for...
0.1 μm soft gold film substrate was ultrasonic bonded with 0.6 mil gold wire, which effectively reduced gold assumption comparing to the traditional 0.3∼0.5 μm soft gold film substrate. The substrate showed good bondability by wire pull test (WPT) and perfect reliability by high temperature storage test (HTST). The bonding structure in failure mode of wire pull test was studied by focused ion beam...
A simple electroless deposition method of fabricating silver nanosheets which is a promising replacement for a high-temperature lead-rich solder used for electronics has been reported. This substrate free deposition method can solve the surface coating problem of the nanostructured silver. By controlling the deposition time, the silver nanosheets with a length of 2μm and a width ranging from 10nm...
A simple electroless deposition method of fabricating silver nanosheets which is a promising replacement for a high-temperature lead-rich solder used for electronics has been reported. This substrate free deposition method can solve the surface coating problem of the nanostructured silver. By controlling the deposition time, the silver nanosheets with a length of 2μm and a width ranging from 10nm...
0.1 μm soft gold film substrate was ultrasonic bonded with 0.6 mil gold wire, which effectively reduced gold assumption comparing to the traditional 0.3∼0.5 μm soft gold film substrate. The substrate showed good bondability by wire pull test (WPT) and perfect reliability by high temperature storage test (HTST). The bonding structure in failure mode of wire pull test was studied by focused ion beam...
Ni/Au microcones were fabricated and thermosonic bonded with Au wire. The thickness of Au film was only 0.05μm. The substrate with Ni/Au microcones showed good Au wire bondability with the average pull strength 4.85 gf and ball shear strength 54.33 gf. Microscopi observation showed that Ni/Au microcones were inserted into Au wire, thus physical interlock between the substrate and Au wire was formed...
Study of diffusion mechanism in low-temperature bonding method based on Cu microcones is reported. A Sn layer was electrodeposited on the Cu microcones and the electrodeposited Cu substrate then annealing at bonding temperature 463 K. IMC grains of Sn/Cu-microcones diffusion samples grew slow with smaller size. The special morphology of Cu microcones was beneficial for the growth of intermetallic...
An ideal low temperature bonding method was studied. Cu cones were prepared by electroless plating. Heating and pressure were used in the bonding process between Cu cones and Sn-3.0Ag-0.5Cu solder. It's a solid state bonding method because the bonding process was performed below the melting point of solder. Shear strength was measured by bonding tester. Morphologies of Cu cones, fracture surfaces...
Molded interconnect system (MIS) is a new generation of substrate technology for traditional QFN, and fine gold wire bonding should be used. While lots of studies focused on the wedge bonding process, the effect of Ni/Pd/Au finish on the bonding force was never verified before. This paper will present a detailed investigation on the wedge bonding on MIS leadframe, and many aspects which affect the...
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