Search results for: Pedro Reviriego
Journal of Electronic Testing > 2019 > 35 > 3 > 413-420
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 211 - 215
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 802 - 804
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 698 - 707
Microelectronics Reliability > 2017 > 78 > C > 205-211
IEEE Transactions on Computers > 2017 > 66 > 10 > 1831 - 1836
IEEE Computer Architecture Letters > 2017 > 16 > 2 > 103 - 106
IEEE Transactions on Reliability > 2017 > 66 > 2 > 518 - 528
IEEE Transactions on Computers > 2017 > 66 > 6 > 1085 - 1090
Microelectronics Reliability > 2017 > 73 > C > 92-96
Microelectronics Reliability > 2017 > 69 > C > 126-129
IEEE Aerospace and Electronic Systems Magazine > 2017 > 32 > 1 > 24 - 28
IEEE Communications Magazine > 2017 > 55 > 6 > 212 - 217
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2219 - 2226
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 12 > 3538 - 3542
Electronics Letters > 2016 > 52 > 23 > 1922 - 1923
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 11 > 1933 - 1943
IEEE Transactions on Computers > 2016 > 65 > 9 > 2932 - 2938