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One of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers have found alternate test as a promising solution in achieving such endeavor. This work prospects the possibilities of using space tessellations along multiple directions in order...
This work proposes a criterion to select a subset of indirect measurements avoiding redundant information. The key idea of the proposal is to reduce the actual number of measurements to be performed to those strictly providing relevant information to the testing procedure, therefore keeping the incurred misclassification costs at acceptable levels. The proposed method selects the measurements presenting...
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