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A low-finesse fiber Fabry-Pérot interferometer (FFPI) assisted by an epoxy resin (ER)-based has been proposed and experimentally demonstrated for temperature measurement. The cavity of the interferometer is a cap of ER at the end-face of the single-mode fiber. A well-defined interference spectrum is obtained with a clear extinction ratio, resulting from the optical phase difference between two light...
Considering the diverse application scenarios involving wireless sensor networks (WSNs), accurate continuous monitoring requires a solution to the essential task of estimating unmeasured locations in the monitored space. In this paper, we utilize Epsilon-Smooth Support Vector Regression (Epsilon-SSVR) to report monitoring information of environment, furthermore we combine spatial and temporal correlation...
A highly integrated joint controller using in a humanoid robot arm has been developed in the paper. The joint controller is highly integrated with position sensors — the hall sensors, the magnetic sensor and the photoelectrical sensor, the torque sensors, the temperature sensor and so on. Besides, it can control and drive the motor in PWM and SVPWM modes. What is more, the joint controller has been...
In this paper, to completely meet the requirements of reliability design in the product designing, an axiom-based reliability design approach is proposed. In light of the axiomatic design principles, products are designed preliminarily to establish their functional requirements, so that according to these, functions preserving requirements are augmented, which constitute a functional requirement preserving...
Power and thermal considerations are becoming limiting factors for submicron circuits as technology scales down. In order to detect abnormal temperature changes so as to detect defects on chip, and increase reliability and service life of devices, an all CMOS temperature sensor for submicron circuits' test is proposed. A current proportion to absolute temperature is generated for achieving linear...
Power and thermal considerations are becoming limiting factors for submicron circuits as technology scales down. In order to detect abnormal temperature changes so as to detect defects on chip, and increase reliability and service life of devices, an all CMOS temperature sensor for submicron circuits' test is proposed. A current proportion to absolute temperature is generated for achieving linear...
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