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It is very difficult, if not impossible, to design hazard free circuits in view of substantial delay uncertainties of gates and interconnects implemented in sub micron technologies. In this paper, we propose diagnosis methods for gate delay faults for such circuits. The fault simulation method employed by us uses eight values and calculates logic values as well as earliest transition times and latest...
This paper presents a diagnosis method for gate delay faults in the presence of clock delay faults. The method deduces candidate faults using a single gate delay fault dictionary and a single clock delay fault dictionary, which contain the information of latest transition time of signals as well as output logic values. To reduce the diagnostic ambiguity we remove those faults from the candidate fault...
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