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In this work, an improved topology of a relaxation oscillator is proposed, dealing with the non-idealities of the comparator stage. The oscillator test chips, manufactured in 0.35-μm CMOS process, have the nominal frequency of 1 MHz and typical power consumption of 210 μW. The area of the oscillator core is 0.04 mm2. The measured temperature variation of the output frequency is ±0.4% in the temperature...
Temperature stability of a high-precision oscillator is characterized by measurements in a temperature chamber. Two time constants are measured for a given temperature of the chamber: (i) time required for the silicon to reach the steady-state temperature obtained by measuring the time-domain voltage response of the on-chip temperature sensor; (ii) time required for the oscillator circuit to reach...
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