Search results for: Chenming Hu
IEEE Electron Device Letters > 2017 > 38 > 1 > 142 - 144
2016 IEEE International Electron Devices Meeting (IEDM) > 30.5.1 - 30.5.4
IEEE Electron Device Letters > 2017 > 38 > 1 > 142 - 144
2016 IEEE International Electron Devices Meeting (IEDM) > 30.5.1 - 30.5.4