The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper investigates the physics of voltage and temperature accelerated breakdown testing of silicon dioxide within the framework of an anode hole injection model which can predict low voltage (3.3 V and below) breakdown lifetime. The field acceleration rate is shown to be independent of temperature, while the reduction of oxide breakdown lifetime at increased temperature is due to the oxide's...
ESD protection capability of SOI CMOS output buffers has been studied with human body model (HBM) stresses of both positive and negative polarity. Experimental results show that the ESD discharge current is absorbed by the NMOSFET alone. Unlike bulk technologies where the bi-directional ESD failure voltages are limited by positive polarity stresses, SOI circuits display a more serious reliability...
An analytic charge-conserving nonquasistatic (NQS) model has been derived for long-channel MOSFETs and implemented in SPICE3. It is based on an approximate solution to the current-continuity equation. Comparison has been made among this model, the numerical solution to the 1-D current-continuity equation, and the quasistatic (QS) SPICE models. The charge injection at the turnoff transient of a NMOS...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.