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AFM has been proved to be a powerful nano-manipulation tool taking advantage of its ultra high resolution and precision. However the large spatial uncertainties associated with AFM tip positioning dual to the PZT nonlinearity and thermal drift are still challenging problems, which hinders its wide application especially in building complex structures In this paper, a probabilistic approach combined...
Nanomanipulation and nanoassembly using atom force microscopy (AFM) is a potential and promising technology for nanomanufacturing. Precise position of the tip of AFM is important to increase the accuracy and efficiency on fabricate complex nanostructures. However at the nano-scale, it is difficult to acquire the tip position expressed by the coordinate in real time due to PZT nonlinearity and thermal...
One of the prerequisite conditions for making a successful manipulation is that the relative position between the AFM tip and the objects can be sensed and controlled accurately. While this prerequisite is grandly hampered by the PZT nonlinearity and thermal drift. Although the PZT nonlinearity can be compensated to a certain extent through mounting a position sensor on the PZT scanner, this method...
AFM based nanomanipulation is still hindered by large spatial uncertainties encountered in tip positioning caused by PZT nonlinearity and thermal drift. In this paper, a landmark based positioning method is proposed to solve these problems. Its pivotal idea is that the tip position is described in a feature based landmark coordinate instead of length based Descartes coordinate. During manipulation,...
Thermal drift in atomic force microscopy (AFM) is one of the major hurdles to achieve accurate and efficient AFM based nanomanipulation. AFM images are all contaminated by the thermal drift which often leads to failed manipulation operations. In this paper, a local scan strategy is applied to identify the thermal drift contamination in the AFM image and then the draft contamination is compensated...
Atomic force microscopy (AFM) has been used as a nanomanipulation tool for a decade taking advantage of its high precision and resolution. But due to thermal drift, nonlinear and hysteresis of piezo scanner, a lot of spatial uncertainties associates with the motion of AFM tip, which makes it difficult to move the tip to a desired position accurately. A lot of work has been carried out to improve the...
Atomic Force Microscope (AFM) has been used to manipulate nano-objects and modify sample surface in nano-scale for many years. But positioning error and losing objects in the manipulation are still hindering the efficiency of AFM based nanomanipulation. Positioning error, which is caused by random drift such as thermal drift and nonlinearity of piezo-actuator, leads AFM tip to a wrong position and...
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