The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We investigated the endurance characteristics of a Cu-doped HfO2 selector device in one transistor-one selector (1T1S) structure, which is fully compatible with standard BEOL process. The device exhibits high endurance of 1010 under 10 μΑ compliance current. However, reduced endurance (105) was observed as increasing the compliance up to 100 μΑ. Under the condition of high operation, intrinsic defect...
Selector with high nonlinearity and low leakage current is critical to solve the sneaking current issue in crossbar memory array. In this work' we present a high performance Cu BEOL compatible threshold switching (TS) selector with several outstanding features' such as high nonlinearity (∼107)' ultra-low off-state leakage current (∼pA)' robust endurance (> 1010)' and sufficient on-state current...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.