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Using the heavy-ion micro-probe facility at GSI in Darmstadt, individual heavy ions can be targeted at specific locations on a die. Circuits to measure SEUs in flip-flops and RAMs, SETs in combinatorial logic and glitches in PLLs were developed and tested. Detailed results for a study of the 130 nm ProASIC3L FPGA tested under Au (94 MeV/mg /cm2) and Ti (19 MeV/mg / cm2) ions are presented.
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