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We introduce two statistical methods for identifying recycled integrated circuits (ICs) through the use of one-class classifiers and degradation curve sensitivity analysis. Both methods rely on statistically learning the parametric behavior of known new devices and using it as a reference point to determine whether a device under authentication has previously been used. The proposed methods are evaluated...
With the increase of the training set??s size, the efficiency of support vector machine (SVM) classifier will be confined. To solve such a problem, a novel pre-extracting method for SVM classification is proposed in this paper. In SVM classification, only support vectors (SVs) have significant influence on the optimization result. We adopt a non-parametric k-NN rule called relative neighborhood graph...
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