Search results for: Wen Wu
IEEE Design & Test > 2016 > 33 > 2 > 30 - 39
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 12 > 2184 - 2194
IEEE Transactions on Systems, Man, and Cybernetics - Part A: Systems and... > 2011 > 41 > 6 > 1213 - 1224
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 8 > 1243 - 1256
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 4 > 541 - 552
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 4 > 553 - 563
2009 International Conference on Test and Measurement > 2 > 425 - 428
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 3 > 277 - 288
IEEE Design & Test of Computers > 2008 > 25 > 6 > 560 - 570
IEEE Design & Test of Computers > 2007 > 24 > 4 > 386 - 396
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2005 > 13 > 6 > 742 - 745
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2003 > 11 > 3 > 474 - 484