Search results for: Lorenzo Ciani
Measurement > 2017 > 108 > C > 152-162
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 11 > 2464 - 2475
Microelectronics Reliability > 2016 > 64 > C > 113-119
Measurement > 2016 > 88 > C > 310-317
Measurement > 2016 > 86 > C > 125-132
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 7 > 1916 - 1921
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 5 > 1179 - 1187