The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A fundamental understanding of N2 and O2 plasma‐induced damage on AlGaN surface is needed in order not to severely degrade electrical characteristics and in order to intelligently achieve the normally‐off operation of AlGaN/GaN‐based electronic devices. A difference between the damage characteristics of Al0.24Ga0.76N thin film surfaces irradiated with N2 and O2 plasmas is reported, from the perspective...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.