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An improved active shape model (ASM), for automatic optical phase identification of microdrill bits in printed circuit board (PCB) production, is presented. To overcome the limitations of conventional ASM on fitting new instants of microdrill bits, six key landmarks are defined for the initialization and optimization of ASM, and a novel method based on projection profiles is also proposed for these...
Inspection of microdrill bits is very important for quality control in Printed Circuit Board (PCB) production. Traditional methods mainly focus on geometric defects inspection. This paper proposes an automatic optical inspection scheme which can not only be used for geometric defects inspection but also identify the phase of microdrill bits. Our approaches employ active shape models (ASM) technique...
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