Search results for: Vishwani D. Agrawal
Journal of Electronic Testing > 2017 > 33 > 5 > 573-589
Journal of Electronic Testing > 2017 > 33 > 2 > 171-187
Lecture Notes in Computer Science > Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation > Session 10: Low-Power Techniques > 436-445