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The direct radio frequency power injection (DPI) method was extended using on-chip voltage waveform monitoring and built-in self-test techniques. Static random access memory (SRAM) has been chosen as a demonstrator of the extended DPI method and exhibits a higher susceptibility against the lower interference frequency. This response is explained when we consider the time length of the threshold against...
This paper presents the measurements of power noise (Vdd noise) waveforms of a 5-stage inverter chain, using on-chip noise monitor circuits (OCM). The fine resolution of 0.4 mV in voltage and 12.5 ps in timing are realized. The undesired voltage variation by signal buffers in I/O cells is carefully eliminated by three means; (i) isolation of power domains, (ii) subtraction of background noise waveforms,...
On-chip and on-board power noise measurements were performed on a 32-bit microprocessor core in a 90-nm CMOS technology. The on-chip voltage noise and on-board near-field magnetic field measurements are related to each other with a unified power delivery network that is formed by on-chip and on-board parasitic components. The significant importance of LSI chip-package-board co-simulation is also discussed...
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