Search results for: J. Huang
2015 IEEE International Electron Devices Meeting (IEDM) > 22.5.1 - 22.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.3.1 - MY.3.4
IEEE Transactions on Communications > 2010 > 58 > 1 > 301 - 310
2015 IEEE International Electron Devices Meeting (IEDM) > 22.5.1 - 22.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.3.1 - MY.3.4
IEEE Transactions on Communications > 2010 > 58 > 1 > 301 - 310