Search results for: Guo-Quan Lu
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 194 - 202
Journal of Electronic Materials > 2012 > 41 > 11 > 3152-3160
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 194 - 202
Journal of Electronic Materials > 2012 > 41 > 11 > 3152-3160