Search results for: Steven Thijs
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 104 - 111
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 589 - 598
EOS/ESD Symposium Proceedings > 1 - 7
EOS/ESD Symposium Proceedings > 1 - 10