Search results for: Alan L. Yuille
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2017 > 39 > 1 > 75 - 86
International Journal of Computer Vision > 2005 > 63 > 2 > 113-140
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2017 > 39 > 1 > 75 - 86
International Journal of Computer Vision > 2005 > 63 > 2 > 113-140