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The complexity of SoCs has been increasing enormously over the last years. This increases the effort for testing the SoCs against natural external influences and fault attacks. These tests require a huge amount of time because of the large fault scenario space. In this paper a novel method is presented on reduction of system test duration. This speed-up is reached by observing memory accesses during...
Over the last years the complexity of SoC's has increased enormously. This increase leads to a high test effort against faults. Therefore, methods have been developed to speed-up fault testing to cope with the increasing number of possible faults. One method is to emulate fault attacks. To cope with the large amount of test data a method to check automatically if a fault injection was successful is...
The increasing level of integration and decreasing size of circuit elements leads to greater probabilities of operational faults. More sensible electronic devices are also more prone to external in?uences by energizing radiation. Additionally not only natural causes of faults are a concern of today's chip designers. Especially smart cards are exposed to complex attacks through which an adversary tries...
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