The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Effective testing to ensure the reliability of integrated circuit (IC) is particularly important, especially in military, aerospace, communications, and other felds. A traditional circuit test structure is shown in Figure 1. Test stimuli are applied to the circuit under test (CUT), and test responses are analyzed so as to determine any fault exists. Traditional testing is faced with several serious...
A new built-in-self-test scheme, referred to as Test Vectors Applied by Circuit-under-Test (TVAC), is proposed in this paper. As the point of view of the paper, Circuit-under-Test (CUT) is no longer only regarded as a test object, but also a kind of available resources. By feedback connecting some of the CUTpsilas interior nodes to the input terminals, the method can generate a test set with low area...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.