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Ion scattering spectrometry (ISS) with time of flight (TOF) analysis is employed to measure the ion fraction of positively charged hydrogen (H + ) projectiles scattered from a well characterized highly oriented pyrolitc graphite (HOPG) surface at a 45° scattering angle, various ingoing/outgoing angles and two different incoming energies (4 and 5keV). In the theoretical approach, the negative...
We studied the modifications introduced in the chemical structure of AlF 3 films by electron irradiation using Auger electron spectroscopy (AES) and factor analysis (FA). We examined the effects of the current density and energy of the electrons on the film composition. We found that the irradiation produces lower aluminum oxidation states (AlF x with 0<x<3, and Al 0 ...
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