Search results for: Shibing Long
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
IEEE Electron Device Letters > 2010 > 31 > 11 > 1299 - 1301
IEEE Electron Device Letters > 2009 > 30 > 12 > 1335 - 1337
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
IEEE Electron Device Letters > 2010 > 31 > 11 > 1299 - 1301
IEEE Electron Device Letters > 2009 > 30 > 12 > 1335 - 1337