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For flip-flop designs fabricated at advanced technology nodes, soft errors are expected to contribute significantly to the overall failure-in-time rates for electronic systems. Since the soft error rates are design and layout dependent, it is important to evaluate different flip-flop designs used in an electronic system. Alpha-particle, high-energy proton, neutron, and heavy-ion experimental results...
22nm node Si SOI Coplanar “N Channel Vertical Dual Carrier Field Effect Transistors” (VDCFET) and its SOC with effective channel length less than 10nm for communication applications are presented.
Spacecraft rendezvous and docking (RVD) is one of the major tasks in space flight mission. This study focused on the influence of control modes and complexity on the Chinese operator performance in manual-controlled RVD. A simulated RVD system was developed. 15 male subjects aged 23–40 participated in the experiment. Examined in the experiment were two control modes (mode A - engine control and mode...
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