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This paper proposes an efficient low-cost strategy for collecting data during radiation experiments on systems-on-chips (SoCs), exploiting the available on-chip design for testability (DfT) structures devised for manufacturing test.The approach combines hardware test and diagnostic features with suitable software tools, which enable accurate measurements and quick transient effects data collection...
We have investigated the effects of biased and unbiased X-ray irradiation on the subsequent time-dependent dielectric breakdown (TDDB) of 130-nm MOSFETs irradiated up to 1Mrad(SiO2). We found a small but measurable increase in TDDB lifetime after irradiation at the worst-case irradiation bias. The influence of radiation bias on subsequent TDDB is more significant in the PMOSFETs than the NMOSFETs...
Field programmable gate arrays (FPGAs) are getting more and more attractive for military and aerospace applications, among others devices. The usage of non volatile FPGAs, like Flash-based ones, reduces permanent radiation effects but transient faults are still a concern. In this paper we propose a new methodology for effectively measuring the width of radiation-induced transient faults thus allowing...
We present new experimental results about the sensitivity of SRAM-based FPGAs to heavy ions. We analyze the static cross section as a function of the FPGA resource type. We also study the soft error rate as function of the accumulated total dose, and investigate the occurrence of multiple bit upsets in the configuration memory. We provide radiation data using a Xilinx Spartan-3 FPGA as test vehicle.
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