Search results for: Jun Zhang
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 400 - 407
IEEE Transactions on Microwave Theory and Techniques > 2011 > 59 > 1 > 21 - 38
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 400 - 407
IEEE Transactions on Microwave Theory and Techniques > 2011 > 59 > 1 > 21 - 38