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A compact near-field sensor for material characterization is proposed. It is composed of a substrate integrated waveguide resonator with coplanar waveguide interfaces, thus enabling easy integration and advanced multilayer technology. The material under test (MUT) is sensed by a tiny tip protruding from the resonator. If placed near this tip the MUT sensitively detunes the sensor. The response can...
The challenging characterization of very lossy materials at low frequencies is investigated by means of a coaxial sensor. The sensitivity of the sensor is analyzed and optimized for lossy materials. Systematic error sources are successfully identified and eliminated by means of a redundant calibration using a partly known reference material. The lower frequency range of the sensor is thereby extended...
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